Postdoctoral Fellow (PREP0004220)

Description

PREP Research Associate

CHIPS Funded Project

 

This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). NIST recognizes that its research staff may want to collaborate with researchers at academic institutions on specific projects of mutual interest and, therefore, requires those institutions to be recipients of a PREP award. The PREP program involves staff from a wide range of backgrounds conducting scientific research across various fields. Individuals in this position will perform technical work supporting the collaboration's scientific research. 

 

Research Title:

Nanometer-Scale Planar Reference Materials (U.S. Citizens Preferred)

 

The work will entail:  

The Material Measurement Laboratory of the National Institute of Standards and Technology is

seeking qualified persons (U.S. Citizens preferred) to join a team of researchers within the

NIST/CHIPS Nanometer-Scale Planar Reference Materials project working with advanced metrology

methods to characterize local physical and chemical properties and map any variation in these

properties of thin, nanometer-scale films deposited on Si (and SiC) wafers. The candidate will

measure and analyze these wafers using X-ray and optical methods to determine, through hybrid

metrology, structural maps for wafers with thin films of interest to the semiconductor community.

 

U.S. Citizen Preferred

 

Key responsibilities will include but are not limited to:

• Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers

• Use lab-based and synchrotron X-ray characterization methods, to determine the structural properties of thin film samples

• Use open-source (python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer

• Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials

• Publish results in archival scientific journals and present results at topical meetings

 

Qualifications

PREP Research Associate

CHIPS Funded Project

 

This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). NIST recognizes that its research staff may want to collaborate with researchers at academic institutions on specific projects of mutual interest and, therefore, requires those institutions to be recipients of a PREP award. The PREP program involves staff from a wide range of backgrounds conducting scientific research across various fields. Individuals in this position will perform technical work supporting the collaboration's scientific research. 

 

Research Title:

Nanometer-Scale Planar Reference Materials (U.S. Citizens Preferred)

 

The work will entail:  

The Material Measurement Laboratory of the National Institute of Standards and Technology is

seeking qualified persons (U.S. Citizens preferred) to join a team of researchers within the

NIST/CHIPS Nanometer-Scale Planar Reference Materials project working with advanced metrology

methods to characterize local physical and chemical properties and map any variation in these

properties of thin, nanometer-scale films deposited on Si (and SiC) wafers. The candidate will

measure and analyze these wafers using X-ray and optical methods to determine, through hybrid

metrology, structural maps for wafers with thin films of interest to the semiconductor community.

 

U.S. Citizen Preferred

 

Key responsibilities will include but are not limited to:

• Plan and conduct research on advanced X-ray metrologies to determine structural (physical and chemical) properties of blanket (non-patterned) thin films on Si and SiC wafers

• Use lab-based and synchrotron X-ray characterization methods, to determine the structural properties of thin film samples

• Use open-source (python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer

• Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials

• Publish results in archival scientific journals and present results at topical meetings

 

Application Instructions

Please upload the following with your application:

 

·       CV/Resume<